Asylum Research
Contact Terry Mehr, Director of Marketing Communications, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466 x224,www.AsylumResearch.com, for additional information.

Monteith G. Heaton: 1952-2012

It is with great sadness that that we pass on the news that we lost Monte, Asylum's EVP of Marketing, on Friday afternoon, May 4th. He died of an unexpected heart attack while returning from one of his regular lunch-time basketball games. He had just turned 60 in March. Monte had been at Asylum since 2008. He will be sorely missed by all. Details regarding services will posted as soon as they are finalized.

Asylum Research Kicks Off New Nanomechanics Webinar Series May 23: “Opportunities, Challenges, and Frontiers of Nanomechanical Measurements with AFM”

April 26, 2012 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), will present Part 1 of three nanomechanics webinars on May 23. This first webinar, entitled “Introduction and Innovations in High Speed Quantitative Nanomechanical Imaging,” will begin with a survey of the mechanical properties that can be investigated with the wide array of available nanoscale property mapping techniques. We will then introduce two new techniques that allow unambiguous interpretation of material nanomechanical properties: AM-FM and Loss Tangent. Amplitude-modulated (AM) atomic force microscopy, also known as tapping mode, is a proven, reliable and gentle imaging method with wide spread applications. Previously, the contrast in tapping mode has been difficult to quantify. The new AM-FM imaging technique combines the features and benefits of normal tapping mode with the quantitative, high sensitivity of Frequency Modulation (FM) mode. Loss Tangent imaging is another recently introduced quantitative technique that recasts the interpretation of phase imaging into one term that includes both the dissipated and stored energy of the tip sample interaction. These techniques allow high speed, low force imaging in tapping mode while providing quantitative Elasticity and Loss Tangent images. Registration details can be found here.

Said presenter and Asylum Research President Dr. Roger Proksch, “Nanoscale mechanical properties cover a breathtaking range of values. For example, the elastic modulus of common materials can range well over five or six orders of magnitude. The same can be said of the loss modulus of materials, with metal, glasses, and ceramics with low dissipation often behaving like ideal elastic solids, while many elastomers behave almost like liquids. A single nanomechanical technique – such as a force curve – is simply insufficient for accurately revealing sample properties and can often yield misleading and even inaccurate conclusions. Put simply, if all you have is a hammer, then all of your problems start to look like nails. During the course of this webinar series we will be looking at the wide range of techniques available to the researcher to cover the wide range of properties with which nature challenges us. A primary goal of this seminar series is to provide researchers with a solid overview of nanomechanical measurements, enabling them to critically interpret these measurements, and to provide a solid foundation for their future research.”

(a) AM-FM image (b) Loss Tangent image and (c) AM-FM histogram and (d) Loss Tangent histogram of a cryotomed latex/epoxy/rubber gum polymer sandwich.  The AM-FM stiffness map clearly resolves the small elastic difference between the latex and rubber gum.  The Loss Tangent difference is even more distinct.

Asylum Research and the Frederick Seitz Materials Research Laboratory at the University of Illinois Urbana-Champaign present the Advanced AFM Workshop, March 21-22

February 16, 2012 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM) and the Frederick Seitz Materials Research Laboratory (FSMRL) at the University of Illinois Urbana Champaign (UIUC), announce The Advanced AFM Workshop on March 21-22, 2012. The workshop will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM), Piezoresponse Force Microscopy (PFM), multifrequency techniques, new scanning techniques for nanomechanical characterization, and a tutorial on IGOR Pro software. UIUC researchers will also present current research on PFM, quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to UIUC personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM scanning techniques.

Jason Cleveland, CEO of Asylum Research, noted, "There are over 200 AFM researchers and students using our instruments at UIUC’s FSMRL. This is an excellent opportunity for us to educate, train, and pass along our knowledge to both established and up and coming researchers as part of our continuing commitment to support the scientists of tomorrow. Exciting research is coming out of many departments at UIUC and we're very pleased that Asylum AFMs have been an important part of their scientific discoveries."

William L. Wilson, Principal Scientist and Director of Central Facilities of the Frederick Seitz Materials Research Laboratory, notes, “As nanofabrication and nanoscale engineering move to the mainstream, the need for a wide array of analytical tools is apparent. Scanning probe microscopies like AFM which were once considered exotic research systems have become workhorse tools. It is extremely important that our user base continue to be conversant with the industry’s newest techniques and technologies. This workshop will provide a unique opportunity for researchers of all disciplines to learn how these techniques can transform their research.”

Added Scott MacLaren, Director of AFM Operations for the MRL, “We are very pleased to be hosting the Advanced AFM Workshop with Asylum.  This is an exceptional opportunity to learn from the experts about advanced AFM techniques.  Our goal is to make this workshop as practical and beneficial as possible for all our researchers."

A small registration fee of $40 will be charged for the workshop for lunches and breaks for both days. Attendees must register at http://mrl.illinois.edu/AFM2012/. Additional information and can be found at http://www.AsylumResearch.com/Events/UIUC2012/.

Bacteriorhodopsin imaged with the Cypher AFM in AC mode using a short cantilever. In the original AFM image (top) missing sub-units are easily resolved (white circle) and its power spectrum shows spots outside of the 10 Angstrom circle, demonstrating sub-nanometer resolution. The lower right image is a correlation average of the original image.

Asylum Research Initiates 2012 Webinar Series February 22: “Smaller and Quieter: Ultra-high Resolution AFM Imaging”

January 30, 2012 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), is initiating its 2012 Webinar Series on February 22. The first webinar will focus on ultra-high resolution imaging. AFM pioneer, inventor and Asylum Research co-founder, Dr. Jason Cleveland, will present “Smaller and Quieter: Ultra-high Resolution AFM Imaging.”

Miniaturization of cantilevers for Atomic Force Microscopy has increased their resonant frequencies and decreased their thermal noise, allowing faster, lower noise measurements. When used in the extremely low noise Cypher™ AFM, these levers have enabled significant improvements in imaging resolution in air and especially in liquids. On crystals, individual atomic point defects can now be routinely resolved, and this higher resolution also extends to biological samples. Examples to be shown include the movement of individual point defects in bacteriorhodopsin, atomic point defects in calcite, and resolution of the double-helix structure of DNA in solution.

“Recent advances in cantilever and AFM system design have enabled imaging and measurements that were previously not possible. I’ll talk about these advances and show some of our latest achievements and capabilities, which I think will be of substantial interest to the full spectrum of AFM users, from beginners to the most experienced,” said Dr. Cleveland.

To register, please go to www3.gotomeeting.com/register/982536366. Attendance will be limited, so early registration is recommended.

Additional Asylum Research webinars in the coming months will include topics such as fast imaging and nanomechanical analysis tools. Details can be found at the www.AsylumResearch.com.

Asylum Research Offers AFM in Biology Class January 25-27, 2012

November 29, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its Atomic Force Microscopy (AFM) in Biology Class will be held January 25-27, 2012 in Santa Barbara, California. The class is open to all AFM users that want to increase their knowledge of AFM in biology and life sciences. This world-renowned class, now in its 14th session, combines lecture with hands-on sessions for personal instruction and interaction with the Asylum technical staff.

“We cover all the essential AFM topics that biologists need and want to learn about – from sample preparation to advanced imaging and force measurements,” said Dr. Nicholas Geisse, Applications Scientist. “The breadth of AFM experience of our staff is unsurpassed – in addition, both our President and CEO participate and class attendees have access to our entire scientific staff. Because only two to three people share an instrument for the hands-on experiments, the training is invaluable."

Commented previous student Dr. Anthony Quinn of the University of Vermont Microscopy Imaging Center, "The AFM in Biology Class was very instructive. The literature, hands-on sample preparation labs, and imaging sessions on the MFP-3D-BIO™ and Cypher™ AFMs were very useful and applicable to our research endeavors. The staff was outstanding in that they made you feel like a part of a caring family – and since the class, the ongoing correspondence and assistance has also been stupendous. Thanks for the hospitality and great course!"

This three-day course is held twice a year. Topics include sample prep, imaging and force measurements on DNA, high resolution imaging of bacteriorhodopsin, force measurements and mapping, imaging and pushing lipid bilayers, and imaging live cells. Hands-on labs will be done on the MFP-3D™ Stand Alone, MFP-3D-BIO and the Cypher AFM, the world's fastest and highest resolution AFM. Class size is limited. More information and a PDF of the registration form can be downloaded here.

Five frames showing a piece of Perpendicular Media Recording (PMR) hard disk degaussed with an in-plane ~0.5 Tesla magnetic field using the VFM2.

Asylum Research Introduces VFM2™ Variable Field Module for Magnetic Atomic Force Microscopy Applications with MFP-3D™ AFMs

November 1, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy, introduces the new Variable Field Module2 (VFM2) for the MFP-3D Atomic Force Microscopes (AFM). The VFM2 is ideal for researchers who want to apply magnetic fields to their atomic force microscopy experiments and applies continuously adjustable magnetic fields parallel to the sample plane approaching one Tesla with one Gauss resolution. The module is useful for magnetic force microscopy (MFM), conductive AFM (C-AFM), and other applications where the sample's properties are magnetic field dependent.

The VFM2 easily attaches to the MFP-3D AFMs and features adjustable pole tips for optimal choice between maximum required field, sample placement and minimum field gradients. The Module uses a unique design incorporating rare earth magnets to produce the magnetic field. Maintaining a steady field produces no heat, thermal drift, or mechanical vibration. Field intensity is software controllable. An integrated Gaussmeter provides a quantitative measure of the applied magnetic field.

For experiments where combined magnetic field and a high tip-sample voltage bias are required, such as for studies of ferroelectric and piezoelectric materials, the VFM2 High Voltage Kit can be easily attached to the VFM2. The High Voltage Kit allows application of tip biases up to ±220V.

Commented Roger Proksch, President of Asylum Research, “Prior to the introduction of the VFM2, high magnetic field measurements required complicated superconducting or water-cooled magnets, neither of which were particularly friendly to low-noise, high precision AFM measurements. Our team, headed by Maarten Rutgers, has made a startling increase in field strength along with increased measurement precision and ease of use. This is truly a major step forward in ambient AFM.”

MacroBuilder screen shot showing the Pallette of available ‘Modules’ from which the user can select to create a ‘Macro’ to automate the Cypher or MFP-3D AFM. Over 50 Modules are currently available with more being added. (Click to enlarge)

New MacroBuilder™ Software Offers Intelligent Automation for Asylum Research Atomic Force Microscopes

October 11, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), provides its full-function MFP-3D™ and Cypher™ Atomic Force Microscopes (AFMs) with superior capabilities which require no programming to perform advanced imaging and measurements. For more advanced, automated, and out-of-the-box experiments, Asylum also provides a user-driven programming language called IGOR. While programming can be a daunting task for the novice, our new MacroBuilder interface allows users to easily implement IGOR customization like a pro – without writing any code – by simply dragging MacroBuilder "Modules" together to form Macros that can automate many measurements and analyses and be saved for repeated use. Each Module performs a specific operation, such as moving the tip to a position, collecting thermal data, or displaying the next saved force plot. Automation can range from simple tasks where the user might want to make a sequence of measurements − say take a series of images with different setpoints or a series of force curves at different positions on a sample − to more sophisticated procedures where the MacroBuilder software makes intelligent decisions; for example, MacroBuilder can decide to change subsequent measurement routines depending on the outcome of previous experiments. An additional benefit is that automated data acquisition can vastly improve throughput and even increase repeatability by removing arbitrariness from the imaging and measurement process. The options are virtually limitless with over 50 Modules included with the Asylum software and more being actively added. MacroBuilder comes standard in the Asylum Research software at no additional cost to the user. No other AFM system offers this kind of customizability and automation, another example of the power and flexibility of Asylum Research AFMs.

Commented Roger Proksch, President of Asylum Research, “MacroBuilder is a major advancement for automating AFM experiments. We expect it will revolutionize the way researchers work by allowing our users to run experiments completely unattended, including decision-making by the software based on pre-set ‘if-then’ instructions. It has already made big changes in the way I use our AFMs – I am really excited to see what our users do with it.”

See more information on MacroBuilder

Dr. Alex Veneman in the Stevenson Research group at UT-Austin preps a sample for Scanning Kelvin Probe Microscopy.

The University of Texas at Austin and Asylum Research Host an Atomic Force Microscopy Workshop on September 14-15, 2011

September 6, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), in conjunction with the Center for Nano- and Molecular Science and Technology (CNM) at the University of Texas at Austin, will be hosting an Atomic Force Microscopy (AFM) Workshop on September 14-15, 2011. The workshop will include lectures and equipment/imaging demonstrations/tutorials for both life science applications and electrical characterization of materials. Topics include force measurements and mapping, Scanning Kelvin Probe Microscopy (SKPM), nanomechanics in biology, piezoresponse force microscopy (PFM), thermal analysis and high resolution imaging with Cypher™, the world's fastest and highest resolution AFM. The workshop is open to current AFM researchers looking to learn more about AFM techniques, as well as those new to AFM that want to learn how AFM can be used in their own research.

“We are extremely pleased to be teaming with University of Texas at Austin for this workshop,” said John Green, EVP for Asylum Research. “The innovative research coming out of CNM affiliated research groups, including research to manipulate, analyze and control nanosized materials, and for understanding structure and reactivity relationships at materials interfaces is truly groundbreaking. Our workshop will also enable researchers to learn more about the capabilities of advanced AFM instrumentation, as well as to get invaluable tips for AFM operation.”

“This is a fantastic opportunity in working with the leading AFM manufacturer to educate and train existing and new practitioners in emerging AFM techniques and protocols across a broad range of applications,” said Prof. Keith Stevenson, CNM Director. “The development of nanoscience and technology depends strongly upon our ability to manipulate, analyze and control matter and energy on the atomic and molecular level. The development of new AFM methods and technology will play a key role in the state-of-the-art probing of electronic, optical, thermal, mechanical and electromechanical properties of nanostructures and devices.”

The first day of the seminar will include lectures from Asylum Research scientists as well as talks on the current work being done at the University of Texas at Austin. Equipment demonstrations will be done on the MFP-3D™ and Cypher AFMs. The second day of the workshop will include an overview lecture and dedicated demonstrations on the Cypher AFM for those interested in high speed, high resolution scanning. Limited spots are available. A registration fee of $20 will be charged to cover lunch and coffee breaks. Additional information and registration for the workshop can be found at www.AsylumResearch.com/Events/UTAustin2011/ .

Asylum Research and Atomic Force DE Appoint Rafaël Barbattini for AFM Support Français

September 1, 2011 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), and its European distributor, Atomic Force F&E GmbH announced today that they have appointed Rafaël Barbattini to provide applications’ and product support for Asylum’s MFP-3D and Cypher AFM products in France. Rafaël has over 20 years experience in service and support of scientific instruments, including positions at IBM, UPSYS, and Veeco. Rafaël will be located in Paris and will be assisting our existing and prospective customers in France as well as surrounding countries. He can be contacted at +33 2 37 41 41 95, barbattini@AsylumResearch.fr.

Dr. Roland Goschke, Managing Director of Atomic Force F&E GmbH, commented: "We are happy to welcome Rafaël to Atomic Force. He is an important addition to our team and will be the primary contact for our growing base of French customers. They will enjoy his broad technical expertise, fast reaction times and competent support in all questions about AFM technology. Working from his office near Paris, he will be able to easily travel to most locations in France for on-site support. He has already impressed us with his knowledge and we are sure that this addition will strengthen Atomic Force's and Asylum Research's position in the French market."

Mr. Barbattini added, “Asylum Research is widely recognized for providing the best applications and product support in the AFM industry. Their MFP-3D™ and Cypher™ are also the best and most reliable AFMs available and my new position is a great opportunity for me to help their customers produce even better results and make more new discoveries. After many years experience in the AFM world I am really pleased to be reunited with some of the best names in the industry, and to be working with and increasing the dissemination of what is clearly the best AFM technology.”

The Figure displays the correlation between topography and the measured out-of-plane (OP) and in-plane (IP) Electrochemical Strain Microscopy (ESM) amplitude and phase signals. To demonstrate the surface characteristics of this LiCoO2 film, topography and deflection signals are shown in images (a) and (b), respectively. Small grains of LiCoO2 with a diameter of approximately 200-300nm can be identified. The maximum OP and IP ESM amplitudes are displayed in images (c) and (d). Both of the latter images show strong variations in the ESM response across the scanned area. In addition, the OP and IP ESM amplitude maps do not show the same features, demonstrating no or minimal cross-talk between the cantilever deflection and torsion. When images (c) and 7(d) are compared, grains with OP and IP response (#1), no OP but IP response (#2), and OP but no IP response (#3) can be identified.

ORNL and Asylum Research Receive Microscopy Today Innovation Award for New Electrochemical Strain Microscopy SPM Technique for Energy Storage Research

August 18, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force microscopy, and Oak Ridge National Laboratory (ORNL) have just received the prestigious Microscopy Today Innovation (MT-10) Award for the development of Electrochemical Strain Microscopy (ESM). ESM is an innovative new scanning probe microscopy (SPM) technique implemented on Asylum’s Cypher™ and MFP-3D™ AFMs that is capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level. ESM is the first technique that measures ionic currents directly, providing a new tool for mapping electrochemical phenomena on the nanoscale. The capability to probe electrochemical processes and ionic transport in solids is invaluable for a broad range of applications for energy generation and storage ranging from batteries to fuel cells. ESM has the potential to aid in these advances with two major improvements over conventional technologies: (a) the resolution to probe nanometer-scale volumes and (b) the inherent ability to decouple ionic from electronic currents with imaging capability extended to a broad range of spectroscopy techniques reminiscent of conventional electrochemical tools.

“We’re extremely excited to have won this prestigious award,” said Roger Proksch, President of Asylum Research. “Our collaboration with the Oak Ridge National Laboratory has put forth many new cutting-edge developments in the field of SPM, including Piezoresponse Force Microscopy, Switching Spectroscopy PFM, and Band Excitation. Asylum Research and our collaborators continue to lead the industry with technical innovation as confirmed by this award.”

Commented Sergei Kalinin, senior research staff member at the ORNL Center for Nanophase Materials Science, “Ionic phenomena in solids directly underpin multiple energy technologies ranging from batteries to fuel cells, as well as emergent electroresistive and memristive memories. Furthermore, very often they can contribute to observed physical phenomena in correlated oxides. Electrochemical Strain Microscopy provides the pathway to study the kinetics and thermodynamics of electrochemical processes in solids on the nanoscale, opening a window in these poorly explored aspects of materials functionality”.

Nina Balke added, “This is the first time we can actually see phenomena in batteries well below the100 nanometer level, observing their charging and degradation on the level of single structural defects.”

Concluded Stephen Jesse, the mastermind behind the development of ESM, “ESM offers an example of a multidimensional SPM technique that provides a new and decisive step towards understanding the nanoscale world of ionic systems.”

About Oak Ridge National Laboratory
Oak Ridge National Laboratory is the Department of Energy's largest science and energy laboratory. ORNL has a staff of more than 4,800 and annually hosts approximately 3,000 guest researchers who spend two weeks or longer in Oak Ridge. As an international leader in a range of scientific areas that support the Department of Energy's mission, ORNL has six major mission roles: neutron science, energy, high-performance computing, systems biology, materials science at the nanoscale, and national security. ORNL's leadership role in the nation's energy future includes hosting the Center for Nanophase Materials Sciences - one of the five Department of Energy Nanoscale Science Research Centers, which serve as user facilities for interdisciplinary research at the nanoscale supported by the DOE Office of Science.

Asylum Research Installs First Cypher™ AFM in China

August 9, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), announced today that it has installed the first Cypher AFM system in China at the South China Normal University in Guangzhou. Cypher, the world’s fastest and highest resolution AFM, was installed in the lab of Professor Xingsen Gao at the SCNU Institute for Advanced Materials by personnel from Asylum Research and Grapes Hangzhou Technology Co. Ltd, Asylum’s representative in China. Professor Gao’s group will use Cypher to investigate advanced piezoelectric, ferroelectric, and multiferroic materials.

Professor Gao commented, “Our new Cypher AFM is the first of its kind in China. We chose Cypher because of its true atomic resolution and sophisticated PFM imaging techniques. We are planning to use it as a stable and powerful platform for probing various nanoscale properties on multifunctional materials with integration of other electrical characterization methods.”

Dr. David Beck, VP of Sales for Asylum Research in the Asia Pacific Region added, “We are very excited to have Professor Gao as our first Cypher user in China. His research on multifunctional materials will take full advantage of Cypher’s revolutionary design, specifically fast scanning, high resolution, and advanced PFM modes such as Dual AC Resonance Tracking (DART) and Band Excitation (BE). We expect that this will be the first of many more Cyphers in China as researchers see the benefits of its unique and advanced capabilities.”

Jason Cleveland, CEO of Asylum Research, will be demonstrating the Cypher AFM system at the upcoming China NANO 2011 conference in Beijing from September 7-9 (Booth C29).

Shown with the Cypher AFM system, left to right: Amir Moshar (Asylum Research), Prof. Xingsen Gao (SCNU), Dr. David Beck (Asylum Research), Yan Feng (HZGLP), and George Jiang (HZGLP).

Euro Atomic Force Microscopy Forum 2011, Zurich, September 7-9

June 23, 2011 – ETH Zurich, Atomic Force F&E GmbH and Asylum Research announce the third Euro AFM Forum 2011 to be held in Zurich, Switzerland on September 7 to 9 in cooperation with Prof. Ralph Spolenak at the campus Science City (Hönggerberg) of the Swiss Federal Institute of Technology Zurich (ETH Zürich). The Euro AFM Forum agenda will include both invited and submitted talks, a poster session, an image contest and the very popular instrument and equipment labs done on the Cypher™ and MFP-3D™ AFMs. Topics will focus on AFM for both materials and life science applications. The EuroForum is open to all AFM researchers that are looking to share their research with the AFM community and to learn tips and tricks of instrumentation and software.

Invited speakers include:
• Lyubov Belova, KTH Stockholm
• Rüdiger Berger, MPIP Mainz
• Ivo Rangelow, TU Ilmenau
• Andras Kis, EPFL Lausanne
• Christan Greiner, KIT Karlsruhe
• Céline Lichtensteiger, University of Geneva
• Karim Bouzehouane, Thales
• Alexander Jakob/Stefan Mayr, IOM Leipzig

Ludger Weisser, General Manager of Atomic Force F&E commented, “We are very pleased to welcome researchers to the EuroForum at ETH Zurich. After successful previous meetings at the University of Muenster and the Technical University of Munich, we have chosen the ETH Zurich due to its high scientific ranking within Europe. With currently seven installations, including two of our new Cypher AFMs, the ETH is currently among the highest concentration of Asylum AFMs in Europe. The Material Science department is known for its great scientific work and we are privileged that they have partnered with us for the 2011 AFM Forum.”

Abstracts are currently being accepted for submitted talks and the poster session, with a deadline of August 15. The first circular is available for download at the conference website at:
http://www.atomicforce.de/Euro-AFM-Forum-2011-Register.php

Asylum Research Offers Nanomechanics Class – AFM and Instrumented Nanoindenting: Techniques and Instrumentation, August 16-18

June 6, 2011 – Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its Nanomechanics Class to be held August 16-18, 2011 in Santa Barbara, California. The class is geared toward beginner-to-intermediate level AFM users who want to gain a greater understanding of nanomechanical characterization techniques and instrumentation using AFM and instrumented nanoindenting. The class combines lectures and hands-on experiments designed to teach AFM theory, instrumentation and scanning modes used for contact mechanics, including properties such as stiffness, adhesion, viscoelasticity and others. Guest speakers will include Donna Hurley, National Institute of Standards and Technology (NIST), and Dalia Yablon, ExxonMobil Research and Engineering. Both researchers are doing ground-breaking work in the field of AFM and nanomechanics.

“We are very excited about offering this new class since nanomechanical characterization using AFM is becoming more essential in a wide range of applications from biomechanics to polymers," said Roger Proksch, President of Asylum Research. "The hands-on sessions are invaluable to demonstrate the breadth of measurements that can be done using AFM instrumentation.”

Topics include:

• Principles of AFM
  
  
• General Nanomechanics
  
  
• Instrumented Nanoindentation
  
  
• Force Measurements and Material Properties
  
  
• Choosing Cantilevers for Specific Scan Methods
  
  
• Phase Imaging and Dissipation
  
  
• Multifrequency Imaging Modes
  
  
• Force Modulation
  
  
• Contact Resonance Imaging

Hands-on equipment labs will be demonstrated on these Asylum Research instruments:

• The Cypher™ AFM, the world's fastest and highest resolution AFM
  
  
• The MFP NanoIndenter for true quantitative measurements and the first AFM-based system that does not use cantilevers as part of the indenting mechanism
  
  
• The MFP-3D™ AFM – closed loop precision and accuracy with the widest range of AFM/SPM capabilities

The Nanomechanics Class lectures and experiments will be tailored to the skill level and topics of interest of the registrants. Class size will be limited so as to provide individualized instruction. Students will be registered on a first-come, first-served basis and must register before July 8, 2011. A PDF of the registration form can be downloaded from the Asylum Research web site at www.AsylumResearch.com/Classes/NanomechanicsClass.pdf

Asylum Research Appoints Dr. Mark Reitsma as Midwest US Sales Director

May 17, 2011 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announced today that it has appointed Dr. Mark Reitsma as its Midwest US Sales Director. Dr. Reitsma received his PhD in Engineering from the University of Newcastle, Australia for his work with AFM on geomaterials. For the past eight years, Mark has been working in the area of AFM force measurement calibration and investigation of materials properties at the U.S. National Institute of Standards and Technology (NIST). Mark will be located in Chicago and will be assisting our existing and prospective customers in the Midwest region, including Kansas, Indiana, Iowa, Illinois, Kentucky, Michigan, Minnesota, Missouri, Nebraska, North Dakota, Ohio, South Dakota, and Wisconsin. Mark can be contacted at (202) 714-7731, mark@asylumresearch.com.

“We are very excited about adding Mark to our sales team,” said John Green, Executive Vice President of Sales for Asylum Research. “His extensive background in AFM and materials research will be a great asset to Asylum Research and our ability to help prospective customers make informed decisions."

Dr. Reitsma added, “After working in AFM metrology and surface science research for many years, I see my position at Asylum Research as a tremendous opportunity to interact with some of the most talented scientists and engineers in the field, helping them to make informed decisions on the Cypher™ and MFP-3D™ AFMs, the very best AFM instrumentation available.”

Asylum Research Announces UK User Meeting and Forum June 21, 2011 in Edinburgh

May 10, 2011 – Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces its 3rd UK User Meeting and Forum to be held June 21 (before the RMS UK SPM Meeting) in Edinburgh, UK. All AFM researchers and Asylum users are invited to share their research with an informative day of technical talks, tutorials, equipment demonstrations and a poster session.

Dr. Chris Mulcahy, Managing Director of Asylum Research UK Ltd. commented, “The User Meeting and Forum is an excellent opportunity to learn what our colleagues are doing in their AFM research. It’s also our chance to show them exciting new technical capabilities through the very popular equipment demonstrations which give researchers the chance to ask-the-expert and learn tips and tricks on the AFM. It’s an educational, fun day spent with our AFM colleagues and a chance to acknowledge our users that are doing ground-breaking research.”

Abstracts are currently being accepted for talks and the poster session. Abstracts can be submitted until May 27, 2011. Prizes will be awarded for the best posters.

A small registration fee of £40 for faculty and £30 for students will be charged to cover teas, lunch and happy hour at the poster session. Additional information, abstract submission, and registration can be found at the conference website: http://www.AsylumResearch.com/Events/UKForum/

Asylum Research Cypher™ Atomic Force Microscope Achieves Point Defect Atomic Resolution in Liquids

April 28, 2011 – Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM) announced today that its revolutionary Cypher AFM is routinely achieving resolution of atomic-scale point defects in liquid. While scanning tunneling microscopes have routinely demonstrated point defect resolution since their invention, this gold standard of true atomic resolution has been more elusive in AFM. Many commercial AFMs can routinely image atomic lattices in ambient and liquid conditions, but the lack of point defects has led most researchers to conclude that the contact areas are typically several atoms across. More recently, instrumental improvements have brought true atomic resolution to ultra-high vacuum (UHV) AFM. Achieving true-atomic resolution under ambient conditions at the liquid-solid interface brings this resolution to an environment highly relevant for much practical research. The Cypher AFM’s industry best signal-to-noise and support for ultra-small probes have enabled this breakthrough in atomic scale imaging.

Commented Jason Cleveland, Asylum Research CEO, “This raises the bar on what people should expect in terms of AFM resolution. Some AFM companies are renaming modes that have been around for years –such as frequency modulation or force volumes– and re-introducing them as “new” modes. Asylum Research has a different approach. We took the most popular imaging mode, AC-mode (also known as tapping, intermittent-contact, or dynamic AFM), kept the name and improved the resolution. The proof is in the images. Prior to this, no other commercial AFM has demonstrated resolution at this level.”

Several technological advancements make this atomic scale imaging achievement possible:

• First is the improved signal-to-noise ratio from the use of ultra-small cantilevers with megahertz resonant frequencies in liquid, a capability unique to Asylum’s state-of-the-art Cypher AFM.
  
  
• Second, the optical lever detection noise floor has been pushed to 25 fm/rtHz, allowing the measurements to remain thermally limited even with very stiff cantilevers and amplitudes as small as 1 Angstrom. These two improvements allow operation with stiff cantilevers and tiny amplitudes, allowing gentle enough imaging that true atomic-sized contact areas are possible.
  
  
• Finally, Cypher’s exceptionally low open-loop noise of 5pm in X, Y, and Z allows the stability to image at this scale, even on a scanner with a 30µm lateral range.

Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate scan direction. Scan size 20nm; Z scale 3.2Å; Cantilever Amplitude 4Å; Cantilever Frequency 454 kHz.

Call for Abstracts for the 2nd Int'l Workshop for Scanning Probe Microscopy for Energy Applications

April 5, 2011 - Abstracts for both oral presentations and a poster session are now being accepted for the 2nd International Workshop for Scanning Probe Microscopy for Energy Applications, June 8-10, 2011, at the Max Planck Institute for Polymers (MPIP) in Mainz, Germany, co-sponsored by AFM manufacturer, Asylum Research. The Workshop will focus on sharing new and innovative research involving characterization of the microscopic mechanisms underpinning solar cell, battery, and fuel cell operations, and materials used for alternative energy applications at the nanometer to micron range. Recent advances/techniques in SPM/AFM used to characterized energy relevant materials and systems will also be addressed. Deadline for abstract submission is May 20, 2011. Solicited abstract topics include, but are not limited to:

• Mapping of carrier dynamics and photo-induced behavior of photovoltaic materials
  
  
• Ionic & electronic transport in fuel cells and lithium-ion batteries
  
  
• Energy harvesting, and energy dissipation imaging by multimodal and band excitation SPM
  
  
• New SPM advances/techniques for characterizing materials including electrochemical strain microscopy, contact resonance, and multi-modal techniques
  
  
• Micro-Raman and NSOM, and probes applied in the field of energy application.

The 2nd Int’l Workshop for Scanning Probe Microscopy for Energy Applications is co-sponsored by MPIP and Asylum Research, the technology leader in Atomic Force/Scanning Probe Microscopy. Additional information on the agenda, invited speakers, abstract submission, and registration can be found at the conference website.

The topographic image (left) of amorphous Si anode in the Si/LiPON/LiCoO2 thin-film battery structure shows the presence of a number of grain boundaries, as well as extensive surface roughness. The ESM image (right) is obtained by measuring the electrochemical strain hysteresis loops at each pixel (100x100 pixel image over 1 micron area). The area hysteresis loop is a measure of Li-ion mobility, and is plotted as 2D map (dark blue corresponds to closed loops, red to open loops). The enhanced Li-ion mobility along the sharp grain boundary is clearly seen, as well as localized hot spots on the diffuse grain boundary and within the grains. The effective resolution of ESM for this material is ~ 10 nm, providing a high-resolution view of Li-ion dynamics in these materials. (Reprinted from N. Balke, et al., Nano Lett. 10, 3420 (2010).

Asylum Research Introduces Electrochemical Strain Microscopy for Energy Storage Research

March 15, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher™ and MFP-3D™ AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy (SPM) technique capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level. ESM is the first technique that measures ionic currents directly, providing a new tool for mapping electrochemical phenomena on the nanoscale. The capability to probe electrochemical processes and ionic transport in solids is invaluable for a broad range of applications for energy generation and storage ranging from batteries to fuel cells. ESM has the potential to aid in these advances with two major improvements over other conventional technologies: (a) the resolution to probe nanometer-scale volumes and (b) the inherent ability to decouple ionic from electronic currents with (c) imaging capability extended to a broad range of spectroscopy techniques reminiscent of conventional electrochemical tools. Nina Balke of ORNL will be presenting recent results at the International Workshop on Scanning Probe Microscopy for Energy Applications (http://www.mpip-mainz.mpg.de/symposium/spm2011/) in Mainz, Germany, June 8-10 2011.

Commented Roger Proksch, President of Asylum Research, “Progress in energy storage and conversion will be greatly facilitated by the ability to study batteries and fuel cells at the level of several nanometers. ESM provides functional imaging of electrochemical phenomena in volumes millions to a billion times smaller than conventional current-based electrochemical techniques. This new technique opens the pathway to understanding energy technology and ionic devices on the level of individual grains and defects, thus bridging macroscopic functionalities and atomistic mechanisms. This in turn will lead to improved energy storage solutions – batteries with extremely high energy densities and long lifetimes and fuel cells with very high energy densities and efficiencies.”

"Traditionally, scanning probe microscopy techniques allowed measurement of electronic currents and short- and long-range forces," added Sergei Kalinin, Senior Research Staff Member in the Center for Nanophase Materials Sciences at ORNL and co-inventor (with Nina Balke and Stephen Jesse) of ESM. "ESM extends this capability to measure ionic currents, and has already been demonstrated for a variety of Li-ion cathode, anode, and electrolyte materials, as well as oxygen electrolytes and mixed electronic-ionic conductors. The ubiquitous presence of concentration-molar volume coupling in electrochemical systems suggests that this technique is in fact universal for solid state ionic imaging – from batteries and solid state to memristive electronics.

Stephen Jesse added “Perhaps even more importantly, the use of band excitation and DART engines allows measurements to be performed on rough surfaces of realistic electrochemical materials, making ESM useful for real materials and devices.”

The EC Cell, shown with heater, provides heating from ambient to 60°C. The heater allows, for example, studies of electrolytes which are not liquids at room temperature.

Asylum Research Introduces Electrochemistry Cell for MFP-3D™ Atomic Force Microscopes

March 9, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemistry Cell (EC Cell) for its MFP-3D™ AFMs. The EC Cell is a versatile platform for electrochemical experiments combined with AFM imaging. The EC Cell accommodates samples (working electrodes) of various sizes, including metal cylinders, flat conducting samples, and even conducting thin films on insulating substrates, and enables studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. Nanoscale topographical changes can be precisely monitored in situ as induced by electrochemical reactions. The cell provides for heating from ambient to 60°C (optional) and can be operated in a fully sealed configuration.

Product Manager, Dr. Maarten Rutgers, commented, “We developed the EC Cell in collaboration with Prof. Richard Compton of the University of Oxford (UK) to conduct electrochemical experiments and, simultaneously, develop images of the changes occurring to the sample. This new tool is already saving researchers a considerable amount of time and, additionally, allows observation of many processes as they occur.”

Tapping/AC mode image of calcite in water, 15nm scan, 1Å height scale. The point defects remained visible through several images, demonstrating Cypher’s true atomic resolution.

Asylum Research Presents Cypher™ UCLA-CNSI Scan Tour/Workshop April 19-20, 2011

March 7, 2011 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the Cypher AFM Scan Tour and Workshop will take place at the UCLA-CNSI’s Nano and Pico Characterization Laboratory on April 19-20, 2011. Each day’s agenda will include a presentation of Cypher’s unique features and allow attendees to “look inside the box” and really get to grips with Cypher’s revolutionary design. Attendees are invited to bring their samples for individual demonstrations of Cypher in real-time, and to experience the unique capabilities of the world’s highest resolution AFM, including closed loop atomic resolution, fast scanning, and advanced ease-of-use features such as SpotOn™ automatic laser and photodiode alignment. Three slots will be available each day for attending groups to assess their own samples using their scanning modes of choice.  Registration is free and all interested parties are welcome. Attendance is limited so early registration is recommended. Attendees may register at www.AsylumResearch.com/Events/CATour/

John Green, Executive Vice President of Sales at Asylum Research commented, “We are very pleased that the California NanoSystems Institute (CNSI) at UCLA will be the first stop on our Cypher California Tour this year. The Nano and Pico Characterization Laboratory is a renowned center providing state-of-the-art research tools and experienced scientist support for its multitude of users and collaborators in the nanoscience community. This workshop will introduce researchers to the advanced capabilities th at Cypher can bring to their research, especially in the dynamic and growing fields of energy storage, polymer materials, and single molecule studies.”

Adam Stieg, Scientific Director of the Nano and Pico Characterization Laboratory (NPC) at UCLA-CNSI, noted “The NPC Lab and CNSI are extremely excited to be a host for Asylum’s 2011 Cypher California Tour. Workshops of this kind provide an extremely valuable opportunity for researchers to gain hands-on experience in the characterization of real samples that would not be possible in other venues. Given the breadth of the scientific community here at UCLA, this extended workshop will serve to expose researchers to the advantages provided by AFM methods in the execution of cutting-edge nanoscience research.”

About UCLA’s CNSI Nano and Pico Characterization Lab
The Nano and Pico Characterization Lab (NPC) in the California NanoSystems Institute (CNSI) at the University of California, Los Angeles (UCLA) provides an unprecedented collection of nanoscale surface analysis instrumentation in a single, multi-user facility. By combining multiple modes of surface analysis, this facility enables thorough investigation of the vast array of physical, chemical and electrical properties necessary for complete study of an experimental system and developing nanotechnologies.

The Nano & Pico Characterization Lab provides both state-of-the-art microscopic techniques to visualize surfaces, adsorbates, nanostructures and devices at the atomic and molecular scale as well as a unique opportunity for researchers to gain insight into local properties under a wide range of experimental conditions. An ever increasing demand for knowledge of how matter behaves at the nanoscale and beyond has forced these measurements and methods to the forefront of nanoscience research.

For additional information, contact Terry Mehr, Director of Marketing Communications, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224, terry@AsylumResearch.com, www.AsylumResearch.com.

Tapping/AC mode image of calcite in water, 15nm scan, 1Å height scale. The point defects remained visible through several images, demonstrating Cypher’s true atomic resolution.

Asylum Research Presents Cypher™ United Kingdom and Ireland Scan Tour for Spring 2011

March 3, 2011 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the continuation of the Cypher AFM Scan Tour that will take place at the University of Southampton, March 29-31, and University College Dublin, April 5-7. Each day’s agenda will include a presentation of Cypher’s unique features and allow attendees to “look inside the box” and really get to grips with Cypher’s revolutionary design. Attendees are invited to bring their samples for individual demonstrations of Cypher in real-time, and to experience the unique capabilities of the world’s highest resolution AFM, including closed loop atomic resolution, fast scanning, and advanced ease-of-use features such as SpotOn™ automatic laser and photodiode alignment. Three slots will be available each day for attending groups to assess their own samples using their scanning modes of choice.  Please contact Chris Mulcahy for additional information (+44(0)1869 255775, chris@asylumresearch.co.uk) or go to www.AsylumResearch.com/UKTour/ to register.  Registration is free and all interested parties are welcome. Attendance is limited so early registration is recommended.

Dr. Chris Mulcahy, Managing Director of Asylum Research UK Ltd. Commented, “We are thrilled to be taking to the road again with Cypher in Southampton and at UCD, Ireland. Our Tour last autumn was very well received with many scientists captivated by Cypher’s fast scanning, ease-of-use and superior closed-loop resolution, imaging and measurement accuracy. We can’t wait to impress more of our region’s AFM users on this second set of tour dates.”

Added Dr. Laurent Bozec of the London Centre for Nanotechnology (LCN), “We were delighted to host a team of researchers from Asylum Research to the LCN in London to demonstrate the capabilities of their new Cypher atomic force microscope. During this three-day event, our researchers had the chance to try this new high resolution microscope and were left with a very positive experience. I believe Cypher is one of if not the best high performance AFM on the market. It shines by its combination of high-resolution and ease of use.”

New Scanning Probe Microscopy Book Features Articles by Asylum Research Scientists and Customers

February 22, 2011 - The new book, “Scanning Probe Microscopy of Functional Materials,” edited by Dr. Sergei Kalinin of the Oak Ridge National Laboratory and Alexei Gruverman of the University of Nebraska, describes cutting-edge nanoscale imaging and spectroscopy advances in the field of atomic force/scanning probe microscopy. The volume includes 18 articles by leading university, U.S. government, and industry researchers, including three authored or co-authored by Dr. Roger Proksch of Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM). Recent research has produced remarkable progress in the development of scanning probe microscopy and this new book is expected to become a seminal work in the field.

Commented author and President of Asylum Research, Roger Proksch, "This new book includes papers on a broad range of new techniques that extend the functionality of SPMs and we think it is an excellent overview for readers interested in quickly getting up to speed on the latest developments. I am delighted to be an author on three of the chapters, which illustrate some of the exciting new capabilities we have incorporated into our MFP-3D™ and Cypher™ AFMs, including Band Excitation, Dual AC Resonance Tracking (DART), Piezoresponse Force Microscopy (PFM), and Ztherm™ modulated thermal analysis."

"SPM has truly become a key characterization tool, not just for selected scientific disciplines, but for the field of nanoscience and technology in general,” notes Alexei Gruverman, co-editor of the book and Associate Professor at the University of Nebraska-Lincoln. “This book presents a snapshot of the most advanced modes of this continuously evolving technique describing nanoscale studies of a variety of functional materials such as complex oxides, biopolymers, and semiconductors.”

"One of the central tasks of this book is to provide an overview of recent developments in emerging fields of SPM, such as nanoscale thermal analysis, band excitation, chemical imaging using mass-spectrometric detection, as well as exotic combinations of SPM and focused X-ray methods, to name a few," added Sergei Kalinin, co-editor of the book and Senior Staff Member at Oak Ridge Center for Nanophase materials. "The unique aspect of this book is a strong representation of the leading SPM companies with their cutting-edge research and SPM developments that are now becoming available in academic, government, and industrial labs as well as techniques just emerging in leading research labs worldwide."

Max Planck Institute and Asylum Research Organize 2nd International Workshop for Scanning Probe Microscopy for Energy Applications

February 17, 2011 - The Max Planck Institute for Polymer Research (MPI-P) and Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), are co-organizing the 2nd International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at the MPI-P in Mainz, Germany from June 8-10, 2011. Following the highly successful first conference with well over 100 attendees at the Oak Ridge National Laboratory in 2010, this 2nd Workshop will focus on sharing new and innovative research involving characterization of the microscopic mechanisms underpinning solar cell, battery, and fuel cell operations, and materials used for alternative energy applications at the nanometer to micron range. Recent advances/techniques in SPM/AFM used to characterized energy relevant materials and systems will also be addressed. The three-day meeting will include invited/contributed talks and a poster session. Equipment labs and tutorials will be held on the last day for demonstration of recently-developed dynamic and multi-spectral SPM modes using Asylum Research’s Cypher™ and MFP-3D™ SPM/AFMs. Abstracts are now being accepted for contributed talks and a poster session. Go to www.mpip-mainz.mpg.de/symposium/spm2011 for information on the agenda, abstract submission, and registration.

Rüdiger Berger of Max Planck Institute for Polymer Research commented, “I am happy that we can host the 2nd International Workshop on Scanning Probe Microscopy for Energy Applications at the Max Planck Institute for Polymer Research. Green energy is one of the most important current issues and we need multidisciplinary teamwork in this area to identify the best strategies.  Surfaces and interfaces play a crucial role in solar cell devices and batteries. We are proud to bring together scientists from all over the world to discuss recent findings and to discuss ways to accelerate the development of green energy technologies.”

“Energy generation, storage, and conversion systems are an integral component of emerging green technologies, including solar power, automotive, and storage components of solar and wind energy economics. The microscopic mechanisms underpinning solar cell, battery and fuel cell operations in the nanometer to micron range are currently not well understood. This workshop is designed to bring together leading scientists in these energy applications of SPM/AFM to share their research and spur additional work to advance the field,” added Roger Proksch, President of Asylum Research.

Asylum Research Offers AFM in Biology Class April 13-15, 2011

February 11, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held April 13-15, 2011 in Santa Barbara, California. The class is open to all Atomic Force Microscopy users that want to increase their knowledge of AFM in biology and life sciences. A high resolution imaging lab on the Cypher™ AFM, the world’s highest resolution AFM, has recently been added to the curriculum. This world-renowned class, now in its lucky 13th session, combines lecture with hands-on sessions for personal instruction and interaction with the Asylum technical staff.

“We cover all the essential AFM topics that biologists need and want to learn about – from sample preparation to advanced imaging and force measurements,” said Sophia Hohlbauch, Applications Scientist. “The breadth of AFM experience of our staff is unsurpassed – both our President and CEO participate and class attendees have access to all of our scientific staff. The class is fun, with a good mix of lecture and equipment time.”

Commented student Fettah Kosar, Technical Manager, Materials Facilities Center for Nanoscale Systems (CNS) Harvard University, “I recently attended the AFM in Biology Class with not much AFM experience and was skeptical about how much knowledge and experience I could gain in just three days. The class turned out to be way above my expectations. It was very well organized with classroom lectures balanced with hands-on exercises. There were never more than two students per microscope. The instructors were all experts in their fields and very approachable. The atmosphere at Asylum was relaxed and fun, making the class extremely enjoyable. Oh, I should also mention that they fed us really well!”

The three day course is held twice a year. Topics include sample prep, force measurements, and imaging on DNA, proteins, force measurements and mapping, lipids and imaging live cells. Hands-on labs will be done on the MFP-3D™ Stand Alone, MFP-3D-BIO™ and the Cypher AFM. Class size is limited. A PDF of the registration form can be downloaded from the Asylum Research web site at www.AsylumResearch.com/Events/BioClassRegistration.pdf.

Asylum Research Hosts Atomic Force Microscopy Workshop at Purdue’s Birck Nanotechnology Center on February 17, 2011

February 1, 2011 - The Birck Nanotechnology Center (BNC) at Purdue University, in conjunction with Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), will be hosting an Atomic Force Microscopy (AFM) Workshop on February 17, 2011. The Birck Nanotechnology Center hosts workshops for its constituents by aligning top tool developers and scientists to educate and train AFM users on state-of-art equipment located within its 187,000 square foot research facility. The workshop will include lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials. Topics include AFM for biological applications, force measurements and mapping, combined AFM and optical imaging, cell imaging, and electrical characterization using conductive AFM. In addition, Purdue researchers Dr. Robert Moon, Assistant Professor of Materials Engineering, and Ryan Wagner, Graduate Student, will present a talk on force-displacement measurements.

“We are extremely pleased to be teaming with the Birck Nanotechnology Center for this workshop and its benefits are twofold – to support the continued education of AFM technology and applications to current researchers at the Center, as well as to introduce the technology to other scientists in and around the vicinity,” said John Green, EVP of Sales for Asylum Research. “Ground-breaking research in AFM, including work done in the Arvind Raman Group, certainly confirms Birck as a leading US nanotechnology center.”

When asked about the upcoming AFM workshop, Dr. Xin Xu, the scanning probe scientist in the Birck Center, said “The new bio-AFM facility built around Asylum's MFP-3D-BIO AFM has greatly improved Birck's scanning probe capability and has been an important step in promoting AFM use across Purdue's campus. I look forward to the workshop and hope it will convince others that the Birck Center is an important scanning probe asset."

The AFM Workshop will be held in Room 2001 at the BNC and is open to current AFM researchers looking to learn more about AFM techniques from Asylum and Purdue experts, as well as to those new to AFM that want to learn how AFM can be used in their own research. A small registration fee of $30 will be charged to cover lunch and coffee breaks. Additional information and registration for the workshop can be found at (www.conf.purdue.edu/atomic).

About Birck Nanotechnology Center at Purdue University
The BNC leverages advances in nanoscale science and engineering to create innovative nanotechnologies addressing societal challenges and opportunities in computing, communications, the environment, security, energy independence, and health. The BNC opened in July of 2005. This facility comprises 187,000 square feet, providing office space for 45 faculty, 21 clerical and technical staff, and up to 180 graduate students. The heart of the building is a 25,000 sq. ft. Class 1-10-100 nanofabrication cleanroom (Scifres Nanofabrication Laboratory), part of which is configured as a biomolecular cleanroom with separate entry and gowning areas and isolated air flow. The building also includes over 22,000 sq. ft. of laboratory space external to the cleanroom, including special low vibration rooms for nanostructures research, with temperature control to less than 0.01 °C. Other laboratories are specialized for nanophotonics, crystal growth, bio-nanotechnology, molecular electronics, MEMS and NEMS, surface analysis, SEM/TEM, electrical characterization, RF systems, instruction and training, precision micro-machining and the Hall Nanometrology Laboratory. In addition, a unique nanotechnology incubator facility is provided for interaction with industry. At the 2009 NSF Nanoscale Science and Engineering Grantee's Conference, Purdue University was noted by Dr. Mihail C. Rocco, Senior Advisor for Nanotechnology for NSF, as the institution that has received the most Nanoscale Science and Engineering awards that year. Three other universities located in the Midwest also ranked in the top five, solidifying the Midwest’s dedication and expertise to nanotechnology research. Additional information can be found on their web site at http://www.purdue.edu/discoverypark/nanotechnology/

Advanced Tutorial Offered at the 3rd Multifrequency AFM Conference in Madrid, Spain, on March 13th

January 26, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), is offering a Bimodal AFM Tutorial on March 13, 2011 in conjunction with the 3rd Multifrequency AFM Conference in Madrid, Spain, March 14-15. The Bimodal AFM Tutorial is free of charge to conference attendees that want to increase their knowledge of multifrequency techniques, including cantilever physics, materials contrast, bimodal imaging theory, simulation with VEDA, and future directions of the technique. Techniques will be demonstrated on AFM instrumentation. Guest lecturers include world-renowned researchers in the field: Arvind Raman of Purdue University, Elena T. Herruzo, Instituto de Microelectrónica de Madrid, CSIC, Garcia Lab, and Roger Proksch of Asylum Research.

“This tutorial is ideal for the researcher that wants to learn more about materials contrast through multifrequency techniques,” said Roger Proksch, President of Asylum Research. “AFM still faces numerous challenges to bring together molecular resolution imaging and quantification of material properties. Understanding higher harmonics and cantilever dynamics is clearly the next evolution of AFM that will take this research to a higher level.”

Commented Prof. Ricardo Garcia, Conference Chair, “In 2011 we will commemorate the 25th anniversary of the invention of the AFM.  AFM has become one of the main pillars that sustain the advanced nanoscience and nanotechnology.  However, the AFM still faces challenges to bring together molecular resolution imaging and quantification of material properties. The need for higher compositional resolution and sensitivity has led to an evolution from single to multifrequency excitation and detection schemes.  The Multifrequency conference and the Biomodal Tutorial aim to bring together AFM experts and newcomers to share knowledge on the instrumentation and theoretical aspects of the next generation of advanced force microscopes.”

The afternoon tutorial will be held at the Ayre Gran Hotel in Colon, Spain, Multifrequency Conference headquarters. Registration for the Advanced Tutorial is limited to 15 people and will be based on a first-come, first-served basis. Additional information and registration can be found on the 3rd Multifrequency AFM Conference web site at http://www.imm.cnm.csic.es/spm/multifrequency/scope.html.

Asylum Research Sets Annual Sales Record

January 19, 2011 - Asylum Research, the technology leader for atomic force and scanning probe microscopy (AFM/SPM), announced today that its 2010 sales set a new record, besting its record-breaking 2009 by nearly 20%. The new record was fueled by increasing acceptance of Asylum’s Cypher™ Atomic Force Microscope, the world’s highest resolution AFM. Sales also accelerated for the MFP-3D-BIO™ AFM, which mounts on an inverted optical microscope platform for the biosciences, and for the versatile MFP-3D™ Stand Alone AFM for physical and materials science applications.

Commented John Green, Asylum Research Executive VP of Sales, “Sales growth at these levels in the present market for a second consecutive year is a tremendous achievement.  The extra efforts of everyone in our worldwide organization contribute to this continued success.  We also want to thank all our users who so eagerly spread the word and continue to drive us to maintain our preeminence as the technology leader in scanning probe and atomic force microscopy.”  

Added Dr. Roger Proksch, Asylum Research President, “Our ongoing rapid growth is the result of the quality and performance of our existing and new products – not to mention the legendary product and applications support our people provide. Our introduction of the innovative new Cypher product line has continued our tradition of excellence. Instead of contenting ourselves with tweaking older products like other AFM companies, we invested to bring forth the first new small sample AFM in more than ten years.”